SUD50N03-09P
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
Typ. a
Max.
Unit
Static
Drain-Source Breakdown Voltage
Gate Threshold Voltage
V (BR)DSS
V GS(th)
V GS = 0 V, I D = 250 μA
V DS = V GS , I D = 250 μA
30
1.0
3.0
V
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current b
Drain-Source On-State Resistance b
Forward Transconductance b
I GSS
I DSS
I D(on)
R DS(on)
g fs
V DS = 0 V, V GS = ± 20 V
V DS = 30 V, V GS = 0 V
V DS = 30 V, V GS = 0 V, T J = 125 °C
V DS = 5 V, V GS = 10 V
V GS = 10 V, I D = 20 A
V GS = 10 V, I D = 20 A, T J = 125 °C
V GS = 4.5 V, I D = 20 A
V DS = 15 V, I D = 20 A
50
20
0.0076
0.0115
± 100
1
50
0.0095
0.015
0.014
nA
μA
A
Ω
S
Dynamic a
Input Capacitance
C iss
2200
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge c
Gate-Source Charge c
Gate-Drain Charge c
C oss
C rss
Q g
Q gs
Q gd
V GS = 0 V, V DS = 25 V, f = 1 MHz
V DS = 15 V, V GS = 4.5 V, I D = 50 A
410
180
11
7.5
5.0
16
pF
nC
Gate Resistance
Turn-On Delay Time c
Rise Time c
Turn-Off Delay Time c
Fall Time c
R g
t d(on)
t r
t d(off)
t f
V DD = 15 V, R L = 0.3 Ω
I D ? 50 A, V GEN = 10 V, R g = 2.5 Ω
0.5
1.5
9
15
22
8
2.1
15
25
35
12
Ω
ns
Source-Drain Diode Ratings and Characteristic T C = 25 °C
Pulsed Current
I SM
100
A
Diode Forward Voltage b
Source-Drain Reverse Recovery Time
V SD
t rr
I F = 50 A, V GS = 0 V
I F = 50 A, di/dt = 100 A/μs
1.2
35
1.5
70
V
ns
Notes:
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
120
90
60
30
V GS = 10 thru 6 V
5V
4V
120
90
60
30
T C = 125 °C
0
3V
2V
0
25 °C
- 55 °C
0
2 4 6 8
10
0
1
2 3 4 5
6
www.vishay.com
2
V DS - Drain-to-Source Voltage (V)
Output Characteristics
V GS - Gate-to-So u rce V oltage ( V )
Transfer Characteristics
Document Number: 71856
S-80793-Rev. G, 14-Apr-08
相关PDF资料
SUD50N03-12P-E3 MOSFET N-CH D-S 30V TO252
SUD50N03-16P-GE3 MOSFET N-CH D-S 30V TO252
SUD50N04-05L-E3 MOSFET N-CH D-S 40V TO252
SUD50N04-09H-E3 MOSFET N-CH D-S 40V TO252
SUD50N04-16P-E3 MOSFET N-CH D-S 40V TO252
SUD50N04-37P-T4-E3 MOSFET N-CH D-S 40V TO252
SUD50N04-8M8P-4GE3 MOSFET N-CH 40V 50A TO-252
SUD50N06-07L-E3 MOSFET N-CH D-S 60V TO252
相关代理商/技术参数
SUD50N03-09P-T1-E3 制造商:Vishay Intertechnologies 功能描述:N CHANNEL MOSFET, 30V, 63A, Transistor Polarity:N Channel, Continuous Drain Curr
SUD50N03-10 功能描述:MOSFET 30V 15A 83W RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SUD50N03-10AP 功能描述:MOSFET 30V 20A 71W RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SUD50N03-10AP-E3 功能描述:MOSFET 30V 20A 71W RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SUD50N03-10BP 功能描述:MOSFET 30V 20A 71W RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SUD50N03-10BP 制造商:Vishay Siliconix 功能描述:MOSFET N D-PAK
SUD50N03-10BP-E3 功能描述:MOSFET 30V 20A 71W RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SUD50N03-10BPT4 制造商:Vishay Siliconix 功能描述:TRANS MOSFET N-CH 30V 20A 3PIN TO-252 - Tape and Reel